@article{3013033,
    title = "Stress-induced transformation of microdefects in neutron irradiated Czochralski silicon",
    author = "Bak-Misiuk, J. and Londos, C.A. and Misiuk, A. and Fytros, L.G. and Surma, H.B. and Trela, J. and Papastergiou, K. and Domagala, J.",
    journal = "International Journal of Inorganic Materials",
    year = "2001",
    volume = "3",
    number = "8",
    pages = "1307-1309",
    issn = "1466-6049",
    doi = "10.1016/S1466-6049(01)00146-5",
    keywords = "silicon, conference paper;  crystal structure;  neutron radiation;  radiation scattering;  stress strain relationship;  X ray diffraction",
    abstract = "Microstructure of neutron irradiated Cz-Si has been examined after out-annealing of irradiation-induced defects and pressure treatment at 1170 K-1 GPa. X-ray diffuse scattering and defect dimensions are related to oxygen concentration and to stress-induced oxygen precipitation. The pressure treatment results in diminished diffuse scattering and defect dimensions. © 2001 Elsevier Science Ltd. All rights reserved."
}