TY - JOUR
TI - Stress-induced transformation of microdefects in neutron irradiated Czochralski silicon
AU - Bak-Misiuk, J.
AU - Londos, C.A.
AU - Misiuk, A.
AU - Fytros, L.G.
AU - Surma, H.B.
AU - Trela, J.
AU - Papastergiou, K.
AU - Domagala, J.
JO - International Journal of Inorganic Materials
PY - 2001
VL - 3
TODO - 8
SP - 1307-1309
PB - 
SN - 1466-6049
TODO - 10.1016/S1466-6049(01)00146-5
TODO - silicon, conference paper;  crystal structure;  neutron radiation;  radiation scattering;  stress strain relationship;  X ray diffraction
TODO - Microstructure of neutron irradiated Cz-Si has been examined after out-annealing of irradiation-induced defects and pressure treatment at 1170 K-1 GPa. X-ray diffuse scattering and defect dimensions are related to oxygen concentration and to stress-induced oxygen precipitation. The pressure treatment results in diminished diffuse scattering and defect dimensions. © 2001 Elsevier Science Ltd. All rights reserved.
ER -