TY - BOOK
TI - Software-based self-testing of embedded processors
AU - Kranitis, N.
AU - Paschalis, A.
AU - Gizopoulos, D.
AU - Xenoulis, G.
PB - SPRINGER NETHERLANDS
PY - 2007
CY - 
SN - 9781402055294
TODO - 10.1007/978-1-4020-5530-0_20
TODO - null
TODO - No silicon integrated circuit (IC) manufacturing process is perfect. Therefore, IC testing is used to screen imperfect devices before shipping them to customers. Chips containing manufacturing defects are potentially malfunctioning chips that may cause system crashes and lead to financial deficit, environmental disaster, and/or jeopardize human life. Moreover, if manufacturing defects are not detected early, the cost of repair is increased by an order of magnitude at each step after the chip fabrication line. It comes naturally that chip testing is an important factor of the business in computer and communications industries, since customers demand reliable products at a reasonable cost and manufacturers, in order to stay competitive in business, must find the means to provide the best products at the lowest cost. © 2007 Springer Science+Business Media B.V.
ER -