TY - JOUR TI - Very-High-Resolution SAR Images and Linked Open Data Analytics Based on Ontologies AU - Espinoza-Molina, D. AU - Nikolaou, C. AU - Dumitru, C.O. AU - Bereta, K. AU - Koubarakis, M. AU - Schwarz, G. AU - Datcu, M. JO - IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing PY - 2015 VL - 8 TODO - 4 SP - 1696-1708 PB - INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS SN - 1939-1404 TODO - 10.1109/JSTARS.2014.2371138 TODO - Electrooptical devices; Metadata; Ontology; Query processing; Satellites; Semantics; Synthetic aperture radar; World Wide Web, Analytics; Linked open datum; queries; Resource description framework; Strabon; TerraSAR-X, Radar imaging, image analysis; image classification; image resolution; satellite imagery; spatial data; synthetic aperture radar; TerraSAR-X TODO - In this paper, we deal with the integration of multiple sources of information such as Earth observation (EO) synthetic aperture radar (SAR) images and their metadata, semantic descriptors of the image content, as well as other publicly available geospatial data sources expressed as linked open data for posing complex queries in order to support geospatial data analytics. Our approach lays the foundations for the development of richer tools and applications that focus on EO image analytics using ontologies and linked open data. We introduce a system architecture where a common satellite image product is transformed from its initial format into to actionable intelligence information, which includes image descriptors, metadata, image tiles, and semantic labels resulting in an EO-data model. We also create a SAR image ontology based on our EO-data model and a two-level taxonomy classification scheme of the image content. We demonstrate our approach by linking high-resolution TerraSAR-X images with information from CORINE Land Cover (CLC), Urban Atlas (UA), GeoNames, and OpenStreetMap (OSM), which are represented in the standard triple model of the resource description frameworks (RDFs). © 2008-2012 IEEE. ER -