Kropman, D. Mellikov, E. Kärner, T. Heinmaa, I. Laas, T. Londos, C.A. Misiuk, A., Interaction of point defects with impurities in the Si-SiO 2system and its influence on the interface properties, Diffusion and Defect Data Part B: Solid State Phenomena, (178-179), 263-266, 2011, Trans Tech Publications, Ltd., 1012-0394