Credibility Analysis for On-Chip Delay Monitors in View of Transistor Variability

Postgraduate Thesis uoadl:1320961 345 Read counter

Unit:
Κατεύθυνση Ηλεκτρονικός Αυτοματισμός (Η/Α, με πρόσθετη εξειδίκευση στην Πληροφορική και στα πληροφοριακά συστήματα)
Library of the School of Science
Deposit date:
2015-04-02
Year:
2015
Author:
Καπατσόρη Χριστιάνα
Supervisors info:
Πασχάλης Αντώνιος Καθηγητής (Επιβλέπων), Σούντρης Δημήτριος Αναπλ. Καθηγητής, Αραπογιάννη Αγγελική Καθηγήτρια
Original Title:
Credibility Analysis for On-Chip Delay Monitors in View of Transistor Variability
Languages:
English
Translated title:
Ανάλυσης Αξιοπιστίας Αισθητήρων καθυστέρησης σε Ψηφίδα, εν όψει Διακυμάνσεων στην Λειτουργία των Τρανζίστορ
Summary:
High reliability has come to be a necessity in today’s circuits as, with the
advancesperformance and the downscale in CMOS technology, the damages by
failures are increasing.
This impacts on circuit’s designing with the need to extensively test and
simulate the systems
and demand an even higher reliability profile.
As the technology tends to reach below deca-nanometre levels in sizing the
embedded
sensors that monitor the circuits and ensure their reliability, face the same
constraintssizing downscale and high quality. Nevertheless they also face
Temperature, Voltage and
Process variations that may interfere with their measurements. These factors
are modelled
as time-zero and dynamic variations and are described by models such as Random
Tele-
graph Noise, Time-Dependent Dielectric Breakdown, Bias Temperature Instability,
optical
phenomenon etc. In spite of the sensors usefulness they are not usually
presented withcredible reliability analysis of their performance under
variations.
In this thesis two sensors are simulated under time-zero variations and a
reliability anal-
ysis has been made. With the use of Spice simulation and tools written in C++
and Perl
we have tested the sensors and extracted statistics on their resolution. The
Interpolation
Method has been the basis of the designs and the statistical analysis has been
made to have
an estimation on the yield of these circuits.
Keywords:
Yield, Time-zero variability, Aging sensors, Interpolation method, Time-to-Digital Converters
Index:
Yes
Number of index pages:
1, 2, 3
Contains images:
Yes
Number of references:
30
Number of pages:
VII, 54
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