Preview new version
Enter
Ελληνικά
Enter
Ελληνικά
Toggle navigation
Browse
Search
Indexes
Help
About
Collections
Conference Proceedings
8th Panhellenic Conference in Informatics Proceedings (Volume 2)
Export Citation
BibTex
RIS
Text
Improved defect detaction in manufacturing using novel multidimensional wavelet feature extraction involving vector quantization and PCA techniques
Conference Paper
uoadl:1042000
726 Read counter
Description
Contents
Original Title:
Improved defect detaction in manufacturing using novel multidimensional wavelet feature extraction involving vector quantization and PCA techniques
Languages of Item:
English
Creator:
Karras, D. A.
Karkanis, S. A.
Iakovidis, D. K.
Maroulis, D. E.
Mertzios, B. G.
Abstract:
Empty abstract
Main subject category:
Digital Signal and Image Processing
Pages (from-to):
165-173
Persistent URL:
https://pergamos.lib.uoa.gr/uoa/dl/object/1042000
The digital material of the item is not available.
