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Conference Proceedings
8th Panhellenic Conference in Informatics Proceedings (Volume 2)
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Improved defect detaction in manufacturing using novel multidimensional wavelet feature extraction involving vector quantization and PCA techniques
Conference Paper
uoadl:1042000
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Description
Contents
Original Title:
Improved defect detaction in manufacturing using novel multidimensional wavelet feature extraction involving vector quantization and PCA techniques
Languages of Item:
English
Creator:
Karras, D. A.
Karkanis, S. A.
Iakovidis, D. K.
Maroulis, D. E.
Mertzios, B. G.
Abstract:
Empty abstract
Main subject category:
Digital Signal and Image Processing
Pages (from-to):
165-173
Persistent URL:
https://pergamos.lib.uoa.gr/uoa/dl/object/1042000
The digital material of the item is not available.
