Improved defect detaction in manufacturing using novel multidimensional wavelet feature extraction involving vector quantization and PCA techniques

Conference Paper uoadl:1042000 648 Read counter

Original Title:
Improved defect detaction in manufacturing using novel multidimensional wavelet feature extraction involving vector quantization and PCA techniques
Languages of Item:
English
Creator:
Karras, D. A.
Karkanis, S. A.
Iakovidis, D. K.
Maroulis, D. E.
Mertzios, B. G.
Abstract:
Empty abstract
Main subject category:
Digital Signal and Image Processing
Pages (from-to):
165-173
The digital material of the item is not available.