Τίτλος:
Dependence of arsenic antisite defect concentration and two dimensional growth mode on LT GaAs growth conditions
Γλώσσες Τεκμηρίου:
Αγγλικά
Περίληψη:
We investigated the dependence of Arsenic antisite defect concentration and that of epitaxial thickness (tepi), above which a transition to three dimensional growth appears, on the growth conditions of LTGaAs layers grown by MBE. The antisite defect concentration and the lattice expansion of LT layers grown at 180°C-250°C initially increases with increasing pressure ratio PAs4/PGa and then saturates. On the other hand, tepi decreases with increasing PAs4/PGa and depends strongly on the presence of roughness on the substrate surface. Our results indicates that the transition to 3D growth in LT layers is caused by the reduced surface mobility of the atoms impinging on the growth front during the epitaxy. We also determined the optimum LT growth conditions in order to achieve both maximum AsGa concentration (∼ 1.4 × 1020 cm-3) and a smooth surface without a transition to 3D growth. © 1998 Elsevier Science B.V. All rights reserved.
Συγγραφείς:
Lagadas, M.
Androulidaki, M.
Hatzopoulos, Z.
Calamiotou, M.
Περιοδικό:
Microelectronic Engineering
DOI:
10.1016/S0167-9317(98)00230-5
